| Tipo de Equipamento Equipment type |
Fabricante Manufacturer |
Modelo Model |
Ano Year |
|---|
| 1. Análises não invasivas in situ
1. in situ non-invasive analysys |
| Lighting heads for quartz halogen bulbs | Hedler (Digi C profi Kit) | 3 x Hedler C12,3 x 1000W bulbs, 3 x Tilt head with umbrella holder, 2 x Umbrella White 80cm, 3x light stand (2.11m), 1x lif barndoor | |
| Photographic digital camera (transform for full spectrum) | Canon | E500D | 2009 |
| High Pass Filter | Hoya | Hoya77mm UV and IR cut (for Vis and UVF) | |
| High Pass Filters | X-Nite | X-Nite 330 X-Nite BP1 X-Nite 780, 850 and 1000 nm |
|
| Narrow–Pass band filters | X-Nite | X-Nite 780 X-Nite 850 X-Nite 1000B-2mm |
|
| InGaAs Infrared reflectrography | Opus Instruments Ltd | OSIRIS | 2010 |
| UV Lamps | Labino | MPXL UV PS135 | |
| Portable spectrophotometer | Datacolor | CheckII Plus | 2006 |
| Portable digital microscope | Dinolite | Premier AD3713TB PRO AM413T-FVW |
|
| X Ray Fluorescence Portable | AMPTEK | Ecplise II, XR-100CR |
2005 |
| 2. Setup analítico em laboratório
2. Lab analytical setup |
| Stereozoom microscope | LEICA | M205C | 2009 |
| Dark field microscope | LEICA | DM2500M | 2009 |
| Polarizing microscope | LEICA | DM2500P | 2009 |
| Scanning electron microscope | HITACHI | S-3700N | 2009 |
| Gass-Chromatigrafher (GC-MS) | SHIMADZU | GC-2010 | 2010 |
| FT-IR spectrometer | BRUKER | HYPERION 3000 | |
| Raman confocal spectrometer | Horiba | Xplora | 2010 |
| X-ray diffractometer | BRUKER | AXSD8 Discovery | 2000 |
| Liquid chromatographer (LC-MS) | ThermoFinnigan | Surveyor | 2009 |